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Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics Author
ISBN-10 UOM:39015058886634
Release 2004
Pages
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Advances in Imaging and Electron Physics has been writing in one form or another for most of life. You can find so many inspiration from Advances in Imaging and Electron Physics also informative, and entertaining. Click DOWNLOAD or Read Online button to get full Advances in Imaging and Electron Physics book for free.



Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics Author Peter W. Hawkes
ISBN-10 0120147750
Release 2004
Pages 576
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* A special volume devoted principally to the role of the late Sir Charles Oatley in the development of the scanning electron microscopeings * It contains historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory * Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Although the scanning electron microscope had a prehistory in Germany and the USA, its real champion was Charles Oatley, who launched his project in the Cambridge University Engineering Department shortly after the end of World War II. A first microscope was built successfully by D. McMullan, one of the Guest Editors of this volume and a succession of progressively improved instruments followed. One in particular, built by K.C.A. Smith was commissioned specially for the Canadian Pulp and Paper Research Institute for use in their Montreal laboratories. All these efforts culminated in the commercial model built by the Cambridge Instrument Company and marketed in 1965 under the trade name, Stereoscan. Although this story has been told on several occasions, in particular in these Advances, it seemed appropriate, in the centenary year of the birth of Sir Charles Oatley, that more details should be published to celebrate these achievements. This volume is the result. It contains not only historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory but also full or partial reproductions of many of the key publications, beginning with McMullan's early paper of 1953 and including Oatley's own "Early history of the scanning electron microscope" (1982). A website has been created, in which supplementary material is collected. This volume is a tribute to a bold pioneering scientist and a vivid record of the creation of the first commercial scanning electron microscopes and of subsequent developments. * A special volume devoted principally to the role of the late Sir Charles Oatley in the development of the scanning electron microscopeings * It contains historical articles and reminiscences by most of the scientists who have worked on the scanning electron microscope in Oatley's laboratory * Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics



Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics Author Kevin Jensen
ISBN-10 9780080556833
Release 2007-11-26
Pages 360
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin Jensen, Naval Research Laboratory, Washington, DC.



Particles and Waves in Electron Optics and Microscopy

Particles and Waves in Electron Optics and Microscopy Author
ISBN-10 9780128052303
Release 2016-05-27
Pages 358
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Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates all the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing



Science of Microscopy

Science of Microscopy Author Peter Hawkes
ISBN-10 9780387497624
Release 2008-08-29
Pages 1322
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This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.



Intense Electron and Ion Beams

Intense Electron and Ion Beams Author Sergey Ivanovich Molokovsky
ISBN-10 3540242201
Release 2005-07-21
Pages 281
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Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams; computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers, and researchers.



Chemical Abstracts

Chemical Abstracts Author
ISBN-10 UOM:39015057321377
Release 2002
Pages
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Chemical Abstracts has been writing in one form or another for most of life. You can find so many inspiration from Chemical Abstracts also informative, and entertaining. Click DOWNLOAD or Read Online button to get full Chemical Abstracts book for free.



Advances in Electronics and Electron Physics

Advances in Electronics and Electron Physics Author
ISBN-10 0080577407
Release 1988-06-30
Pages 508
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Advances in Electronics and Electron Physics



Electron Backscatter Diffraction in Materials Science

Electron Backscatter Diffraction in Materials Science Author Adam J. Schwartz
ISBN-10 030646487X
Release 2000-09-30
Pages 339
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Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).



Structural Electron Crystallography

Structural Electron Crystallography Author D.L. Dorset
ISBN-10 0306450496
Release 1995-08-31
Pages 452
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Drawing on the work of B.K. Vainshtein and others, this account of the technique used in modern structural research emphasizes the quantitative determination of crystal structures from electron diffraction data. The first five chapters provide an overview of quantitative crystallography using the el



Solid State Physics

Solid State Physics Author H. Ibach
ISBN-10 354043870X
Release 2003
Pages 501
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"This new edition of the popular introduction to solid-state physics provides a comprehensive overview on basic theoretical and experimental concepts of materials science. Additional sections emphasize current topics in solid-state physics." "Notably, sections on important devices, aspects of non-period structures of matter, phase transitions, defects, superconductors and nanostructures have been added. Students will benefit significantly from solving the exercises given at the end of each chapter. This book is intended for university students in physics, engineering and electrical engineering. This edition has been carefully revised, updated, and enlarged."--BOOK JACKET.Title Summary field provided by Blackwell North America, Inc. All Rights Reserved



Advances in Electronics and Electron Physics

Advances in Electronics and Electron Physics Author Toshio Sakurai
ISBN-10 0120145820
Release 1989
Pages 299
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Advances in Electronics and Electron Physics has been writing in one form or another for most of life. You can find so many inspiration from Advances in Electronics and Electron Physics also informative, and entertaining. Click DOWNLOAD or Read Online button to get full Advances in Electronics and Electron Physics book for free.



Subject Guide to Books in Print

Subject Guide to Books in Print Author
ISBN-10 STANFORD:36105025888533
Release 2003
Pages
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Subject Guide to Books in Print has been writing in one form or another for most of life. You can find so many inspiration from Subject Guide to Books in Print also informative, and entertaining. Click DOWNLOAD or Read Online button to get full Subject Guide to Books in Print book for free.



Handbook of Biological Confocal Microscopy

Handbook of Biological Confocal Microscopy Author James Pawley
ISBN-10 9781461571339
Release 2012-12-06
Pages 232
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In 1987 the Electron Microscopy Society of America (EMSA) going to drive important scientific discoveries across wide areas under the leadership of J. P. Revel (Cal Tech) initiated a major of physiology, cellular biology and neurobiology. They had been program to present a discussion of recent advances in light looking for a forum in which they could advance the state of microscopy as part of the annual meeting. The result was three the art of confocal microscopy, alert manufacturers to the lim special LM sessions at the Milwaukee meeting in August 1988: itations of current instruments, and catalyze progress toward The LM Forum, organized by me, and Symposia on Confocal new directions in confocal instrument development. LM, organized by G. Schatten (Madison), and on Integrated These goals were so close to those of the EMSA project that Acoustic/LM/EM organized by C. Rieder (Albany). In addition, the two groups decided to join forces with EMSA to provide there was an optical micro-analysis session emphasizing Raman the organization and the venue for a Confocal Workshop and techniques, organized by the Microbeam Analysis Society, for NSF to provide the financial support for the speakers expenses a total of 40 invited and 30 contributed papers on optical tech and for the publication of extended abstracts.



Basics of Interferometry

Basics of Interferometry Author P. Hariharan
ISBN-10 0080465455
Release 2010-07-28
Pages 248
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Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more consise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography. Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. Basics of Interferometry, Second Edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons. Outstanding introduction to the world of optical interferometry with summaries at the begining and end of each chapter, several appendices with essential information, and worked numerical problems Practical details enrich understanding for readers new to this material New chapters on white-light microscopy for medical imaging and interference with single photons(quantum optics)



Handbook of Physics

Handbook of Physics Author Walter Benenson
ISBN-10 0387952691
Release 2002-03-21
Pages 1181
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Handbook of Physics is a veritable toolbox for rapid access to a wealth of physics information for everyday use in problem solving, homework, and examinations. This complete reference includes not only the fundamental formulas of physics but also experimental methods used in practice.



Higher Order Numerical Methods for Transient Wave Equations

Higher Order Numerical Methods for Transient Wave Equations Author Gary Cohen
ISBN-10 354041598X
Release 2001-11-06
Pages 349
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"To my knowledge [this] is the first book to address specifically the use of high-order discretizations in the time domain to solve wave equations. [...] I recommend the book for its clear and cogent coverage of the material selected by its author." --Physics Today, March 2003