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Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits

Essentials of Electronic Testing for Digital  Memory and Mixed Signal VLSI Circuits Author M. Bushnell
ISBN-10 9780306470400
Release 2006-04-11
Pages 690
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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Models in Hardware Testing

Models in Hardware Testing Author Hans-Joachim Wunderlich
ISBN-10 9789048132829
Release 2009-11-12
Pages 257
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Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.

Advances in Electronic Testing

Advances in Electronic Testing Author Dimitris Gizopoulos
ISBN-10 9780387294094
Release 2006-01-22
Pages 412
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This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Fault Tolerance Techniques for SRAM Based FPGAs

Fault Tolerance Techniques for SRAM Based FPGAs Author Fernanda Lima Kastensmidt
ISBN-10 9780387310695
Release 2007-02-01
Pages 184
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This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Some of these are based on new fault-tolerant architecture, and others on protecting the high-level hardware description before synthesis in the FPGA. The text helps the reader choose the best techniques project-by-project, and to compare fault tolerant techniques for programmable logic applications.

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures Author Laung-Terng Wang
ISBN-10 0080474799
Release 2006-08-14
Pages 808
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Digital Timing Measurements

Digital Timing Measurements Author Wolfgang Maichen
ISBN-10 9780387314198
Release 2006-10-03
Pages 240
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As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this field an engineer needs to understand instrumentation, measurement techniques, signal integrity, jitter and timing concepts, and statistics. This book gives a compact, practice-oriented overview on all these subjects with emphasis on useable concepts and real-life guidelines.

Music and Disorders of Consciousness Emerging Research Practice and Theory

Music and Disorders of Consciousness  Emerging Research  Practice and Theory Author Wendy L. Magee
ISBN-10 9782889450992
Release 2017-02-28
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Music processing in severely brain-injured patients with disorders of consciousness has been an emergent field of interest for over 30 years, spanning the disciplines of neuroscience, medicine, the arts and humanities. Disorders of consciousness (DOC) is an umbrella term that encompasses patients who present with disorders across a continuum of consciousness including people who are in a coma, in vegetative state (VS)/have unresponsive wakefulness syndrome (UWS), and in minimally conscious state (MCS). Technological developments in recent years, resulting in improvements in medical care and technologies, have increased DOC population numbers, the means for investigating DOC, and the range of clinical and therapeutic interventions under validation. In neuroimaging and behavioural studies, the auditory modality has been shown to be the most sensitive in diagnosing awareness in this complex population. As misdiagnosis remains a major problem in DOC, exploring auditory responsiveness and processing in DOC is, therefore, of central importance to improve therapeutic interventions and medical technologies in DOC. In recent years, there has been a growing interest in the role of music as a potential treatment and medium for diagnosis with patients with DOC, from the perspectives of research, clinical practice and theory. As there are almost no treatment options, such a non-invasive method could constitute a promising strategy to stimulate brain plasticity and to improve consciousness recovery. It is therefore an ideal time to draw together specialists from diverse disciplines and interests to share the latest methods, opinions, and research on this topic in order to identify research priorities and progress inquiry in a coordinated way. This Research Topic aimed to bring together specialists from diverse disciplines involved in using and researching music with DOC populations or who have an interest in theoretical development on this topic. Specialists from the following disciplines participated in this special issue: neuroscience; medicine; music therapy; clinical psychology; neuromusicology; and cognitive neuroscience.

Proceedings International Symposium on Asynchronous Circuit and Systems

Proceedings     International Symposium on Asynchronous Circuit and Systems Author
ISBN-10 UIUC:30112058570844
Release 2002
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Proceedings International Symposium on Asynchronous Circuit and Systems has been writing in one form or another for most of life. You can find so many inspiration from Proceedings International Symposium on Asynchronous Circuit and Systems also informative, and entertaining. Click DOWNLOAD or Read Online button to get full Proceedings International Symposium on Asynchronous Circuit and Systems book for free.

Digital Systems Testing and Testable Design

Digital Systems Testing and Testable Design Author Miron Abramovici
ISBN-10 0780310624
Release 1994-09-27
Pages 672
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This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Digital Logic Testing and Simulation

Digital Logic Testing and Simulation Author Alexander Miczo
ISBN-10 0471457779
Release 2003-10-24
Pages 696
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Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

Phase Locked Loops 6 e

Phase Locked Loops 6 e Author Roland E. Best
ISBN-10 9780071595216
Release 2007-08-13
Pages 490
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The Definitive Introduction to Phase-Locked Loops, Complete with Software for Designing Wireless Circuits! The Sixth Edition of Roland Best's classic Phase-Locked Loops has been updated to equip you with today's definitive introduction to PLL design, complete with powerful PLL design and simulation software written by the author. Filled with all the latest PLL advances, this celebrated sourcebook now includes new chapters on frequency synthesis...CAD for PLLs...mixed-signal PLLs...all-digital PLLs...and software PLLs_plus a new collection of sample communications applications. An essential tool for achieving cutting-edge PLL design, the Sixth Edition of Phase-Locked Loops features: A wealth of easy-to-use methods for designing phase-locked loops Over 200 detailed illustrations New to this edition: new chapters on frequency synthesis, including fractional-N PLL frequency synthesizers using sigma-delta modulators; CAD for PLLs, mixed-signal PLLs, all-digital PLLs, and software PLLs; new PLL communications applications, including an overview on digital modulation techniques Inside this Updated PLL Design Guide • Introduction to PLLs • Mixed-Signal PLL Components • Mixed-Signal PLL Analysis • PLL Performance in the Presence of Noise • Design Procedure for Mixed-Signal PLLs • Mixed-Signal PLL Applications • Higher Order Loops • CAD and Simulation of Mixed-Signal PLLs • All-Digital PLLs (ADPLLs) • CAD and Simulation of ADPLLs • The Software PLL (SPLL) • The PLL in Communications • State-of-the-Art Commercial PLL Integrated Circuits • Appendices: The Pull-In Process • The Laplace Transform • Digital Filter Basics • Measuring PLL Parameters

An Introduction to Mixed Signal IC Test and Measurement

An Introduction to Mixed Signal IC Test and Measurement Author Gordon W. Roberts
ISBN-10 0199796211
Release 2011-10-14
Pages 836
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With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems.

System on Chip Test Architectures

System on Chip Test Architectures Author Laung-Terng Wang
ISBN-10 0080556809
Release 2010-07-28
Pages 896
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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems Author Michael Nicolaidis
ISBN-10 1441969934
Release 2010-09-24
Pages 318
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This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

The Art of Game Design

The Art of Game Design Author Jesse Schell
ISBN-10 9781498759564
Release 2015-09-15
Pages 600
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Good game design happens when you view your game from as many perspectives as possible. Written by one of the world's top game designers, The Art of Game Design presents 100+ sets of questions, or different lenses, for viewing a game’s design, encompassing diverse fields such as psychology, architecture, music, visual design, film, software engineering, theme park design, mathematics, puzzle design, and anthropology. This Second Edition of a Game Developer Front Line Award winner: Describes the deepest and most fundamental principles of game design Demonstrates how tactics used in board, card, and athletic games also work in top-quality video games Contains valuable insight from Jesse Schell, the former chair of the International Game Developers Association and award-winning designer of Disney online games The Art of Game Design, Second Edition gives readers useful perspectives on how to make better game designs faster. It provides practical instruction on creating world-class games that will be played again and again.

Power Constrained Testing of VLSI Circuits

Power Constrained Testing of VLSI Circuits Author Nicola Nicolici
ISBN-10 9780306487316
Release 2006-04-11
Pages 178
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This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

On Line Testing for VLSI

On Line Testing for VLSI Author Michael Nicolaidis
ISBN-10 9781475760699
Release 2013-03-09
Pages 160
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Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.