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Materials Characterization

Materials Characterization Author Yang Leng
ISBN-10 9783527670796
Release 2013-08-07
Pages 392
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Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.



Materials Characterization

Materials Characterization Author Yang Leng
ISBN-10 9780470822999
Release 2009-03-04
Pages 384
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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.



Materials Characterization

Materials Characterization Author Yang Leng
ISBN-10 3527334637
Release 2013-10-28
Pages 392
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Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author′s experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions – in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X–ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X–ray energy dispersive spectroscopy, fluorescence X–ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra–red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy–to–read text, the book never loses sight of its intended audience.



Encyclopedia of Materials Characterization

Encyclopedia of Materials Characterization Author C. R. Brundle
ISBN-10 0750691689
Release 1992
Pages 751
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Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.



Materials Characterization Techniques

Materials Characterization Techniques Author Sam Zhang
ISBN-10 9781420042955
Release 2008-12-22
Pages 344
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Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today—whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material’s structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use. Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. This useful volume: Explores scientific processes to characterize materials using modern technologies Provides analysis of materials’ performance under specific use conditions Focuses on the interrelationships and interdependence between processing, structure, properties, and performance Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanisms, and materials Covers electron, X-ray-photoelectron, and UV spectroscopy; scanning-electron, atomic-force, transmission-electron, and laser-confocal-scanning-florescent microscopy, and gel electrophoresis chromatography Presents the fundamentals of vacuum, as well as X-ray diffraction principles Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations. Instead, they emphasize useful basic principles and applications of modern technologies used to characterize engineering materials, helping readers grasp micro- and nanoscale properties. This text will serve as a valuable guide for scientists and engineers involved in characterization and also as a powerful introduction to the field for advanced undergraduate and graduate students.



Microstructural Characterization of Materials

Microstructural Characterization of Materials Author David Brandon
ISBN-10 9781118681480
Release 2013-03-21
Pages 552
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Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.



Characterization of Catalytic Materials

Characterization of Catalytic Materials Author Israel E. Wachs
ISBN-10 9781606501849
Release 2010
Pages 202
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Catalytic materials are essential to nearly every commercial and industrial chemical process in order to make reaction times faster and more efficient. Understanding the microstructure of such materials is essential to designing improved catalytic properties. This volume in the materials characterization series reviews the more common types characterization methods used for understanding surface and structural properties of most types of commercially used catalytic materials. Covers both bulk metals and alloys as well as supported metals metal oxides and metal sulfides Characterization techniques for zeolites and molecular sieves as well as alumina pillared clays Concise summaries of major characterization technologies for catalytic materials, including Auger Electron Spectroscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis, Scanning Electron Microscopy, and Transmission Electron Spectroscopy



Practical Materials Characterization

Practical Materials Characterization Author Mauro Sardela
ISBN-10 9781461492818
Release 2014-07-10
Pages 237
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Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.



Concise Encyclopedia of Materials Characterization

Concise Encyclopedia of Materials Characterization Author R.W. Cahn
ISBN-10 9781483287515
Release 2016-01-22
Pages 670
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To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.



Materials Characterization Using Nondestructive Evaluation NDE Methods

Materials Characterization Using Nondestructive Evaluation  NDE  Methods Author Gerhard Huebschen
ISBN-10 9780081000571
Release 2016-03-23
Pages 320
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Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials



Advanced Characterization Techniques for Thin Film Solar Cells

Advanced Characterization Techniques for Thin Film Solar Cells Author Daniel Abou-Ras
ISBN-10 9783527699049
Release 2016-07-13
Pages 760
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The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.



Spectroscopic Methods for Nanomaterials Characterization

Spectroscopic Methods for Nanomaterials Characterization Author Sabu Thomas
ISBN-10 9780323461467
Release 2017-05-19
Pages 444
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Nanomaterials Characterization Techniques, Volume Two, part of an ongoing series, offers a detailed analysis of the different types of spectroscopic methods currently being used in nanocharacterization. These include, for example, the Raman spectroscopic method for the characterization of carbon nanotubes (CNTs). This book outlines the different kinds of spectroscopic tools being used for the characterization of nanomaterials and discusses under what conditions each should be used. The book is intended to cover all the major spectroscopic techniques for nanocharacterization, making it an important resource for both the academic community at the research level and the industrial community involved in nanomanufacturing. Explores how spectroscopy and X-ray-based nanocharacterization techniques are applied in modern industry Analyzes all the major spectroscopy and X-ray-based nanocharacterization techniques, allowing the reader to choose the best for their situation Presents a method-orientated approach that explains how to successfully use each technique



Physical Methods for Materials Characterisation

Physical Methods for Materials Characterisation Author P. E. J. Flewitt
ISBN-10 0750303204
Release 1994-01-01
Pages 517
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This important textbook provides a comprehensive description of the large range of techniques currently in use for the characterisation of the microstructure of materials. Written for students and researchers learning new techniques, the book carefully explains the interactions between various radiations with materials, and shows how these interactions form the basis of the specific evaluation and measurement methods. Sections of the text deal with basic science and technology, such as diffraction laws, vacuum techniques and radiation sources. The characterisation techniques are divided on the basis of the interrogating radiation source, and cover optical and x-ray techniques, electron microscopy and spectroscopy, ion and particle microscopy and spectroscopy. Computer applications in instrument control, data acquisition and analysis are discussed, together with coverage of simulation techniques. It is suitable for for final year undergraduate students and graduate courses on materials. This series of books in Materials Science and Engineering is designed to meet the needs of graduate students and senior undergraduates. The books provide useful introductory surveys of particular areas of Materials Science and Engineering. Although not primarily resarch texts, the books point out the direction which research is currently taking and where it is expected to lead. Physical Methods for Microstructural Characterisation provides a comprehensive description of the large range of techniques currently in use for the charactersiation of the microstructure of materials. Introductory chapters cover the basic physics used to describe the background to materials microstructure and the interaction of various types of radiation with materials. Analysis is given for optical, x-ray and particle beam interactions, since these form the basis of the specific measurement and evaluation techniques. Much of the hardware involved is dependent on a vacuum environment, and a full chapter is devoted to this topic. The early chapters lay down the basic foundations which are incorporated in following chapters dealing with specific techniques. The characterisation techniques are divided on the basis of the interrogating radiation source, with separate chapters dealing with optical and x-ray techniques, electron microscopy and spectroscopy, and ion and particle microscopy and spectroscopy. Within each of these chapters, material is given covering the radiation sources, the construction and layout of instrumentaiton and the analysis of data. A final chapter deals with the use of computer equipment in the collection and analysis of data. The book is thoroughly illustrated with examples of analytical equipment and with the different kinds of output to be expected, together with comments on the analysis and interpretation of images and spectra. The book is suitable as a textbook, and it is also intended that the book should act as a guide for inexperienced researchers who need to learn the best way to use a specific technique for any given groups of materials. Physical Methods for Microstructural Characterisation will be of interest to advanced undergraduates, postgraduates and researchers in physics, materials science, and engineering. Peter Flewitt, following a period at the Unviersity of Sheffield, joined the Central Electricity Generating Board, and he currently holds the post of Section Manager in the Technology Division of Nuclear Electric at Berkeley in Gloucestershire. He is also a Visiting Professor in the Deparment of Physics at the University of Surrey. Bob Wild studied at Reading University before spending two years in the Physics Department of University of Virginia, USA. He returned to join the Central Electricity Generating Board, and is now Senior Research Fellow at the Interface Analysis Cenre of the University of Bristol, UK.



Nanocharacterization Techniques

Nanocharacterization Techniques Author Osvaldo de Oliveira, Jr
ISBN-10 9780323497794
Release 2017-03-18
Pages 222
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Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered Serves as an important, go-to reference for materials scientists and engineers



Characterization of Biomaterials

Characterization of Biomaterials Author Susmita Bose
ISBN-10 9780128070956
Release 2013-03-12
Pages 450
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This brief introductory chapter provides a broad overview of materials, biomaterials and the need to understand different techniques to characterize biomaterials. From this chapter, the reader can gain a perspective on how the rest of the topics in different chapters are divided to fully comprehend this inherently multidisciplinary field. Application of appropriate characterization tools can not only save time to fully evaluate different biomaterials, it can also make commercial biomedical devices safer. In the long run, safer biomedical devices can only reduce the pain and suffering of mankind, a dream that resonates with every biomedical researcher.



Scanning Auger Electron Microscopy

Scanning Auger Electron Microscopy Author Martin Prutton
ISBN-10 9780470866788
Release 2006-05-01
Pages 384
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This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an outlook for the future of Auger microscopy.



Characterization of Composite Materials

Characterization of Composite Materials Author Hatsuo Ishida
ISBN-10 9781483292373
Release 2013-10-22
Pages 250
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Now, in one book, there is coverage of modern surface analytical techniques applied specifically to composite materials. Centering around spectroscopic characterization of composites and polymer-matrix composities, Characterization of Composite Materials covers techniques with a demonstrated use for composite stuides along with promising new techniques such as STM/AFM and special Raman spectroscopy. Each chapter will cover a specific technique and will provide basic background information, theories of the technique, and application examples, including futuristic state-of-the-art applications. Detailed information about the individual characterization techniques mentioned can be found in the Encyclopaedia of Materials Cahracterization, the companion volume in the Materials Characterization Series: surfaces, interfaces, thin films.