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Materials Characterization Techniques

Materials Characterization Techniques Author Sam Zhang
ISBN-10 9781420042955
Release 2008-12-22
Pages 344
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Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today—whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material’s structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use. Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. This useful volume: Explores scientific processes to characterize materials using modern technologies Provides analysis of materials’ performance under specific use conditions Focuses on the interrelationships and interdependence between processing, structure, properties, and performance Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanisms, and materials Covers electron, X-ray-photoelectron, and UV spectroscopy; scanning-electron, atomic-force, transmission-electron, and laser-confocal-scanning-florescent microscopy, and gel electrophoresis chromatography Presents the fundamentals of vacuum, as well as X-ray diffraction principles Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations. Instead, they emphasize useful basic principles and applications of modern technologies used to characterize engineering materials, helping readers grasp micro- and nanoscale properties. This text will serve as a valuable guide for scientists and engineers involved in characterization and also as a powerful introduction to the field for advanced undergraduate and graduate students.



Materials Characterization

Materials Characterization Author Yang Leng
ISBN-10 9783527670796
Release 2013-08-07
Pages 392
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Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.



Encyclopedia of Materials Characterization

Encyclopedia of Materials Characterization Author C. R. Brundle
ISBN-10 0750691689
Release 1992
Pages 751
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Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.



Materials Characterization Using Nondestructive Evaluation NDE Methods

Materials Characterization Using Nondestructive Evaluation  NDE  Methods Author Gerhard Huebschen
ISBN-10 9780081000571
Release 2016-03-23
Pages 320
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Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials



Concise Encyclopedia of Materials Characterization

Concise Encyclopedia of Materials Characterization Author R.W. Cahn
ISBN-10 9781483287515
Release 2016-01-22
Pages 670
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To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.



Optical Techniques for Solid State Materials Characterization

Optical Techniques for Solid State Materials Characterization Author Rohit P. Prasankumar
ISBN-10 9781439814376
Release 2016-04-19
Pages 748
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Over the last century, numerous optical techniques have been developed to characterize materials, giving insight into their optical, electronic, magnetic, and structural properties and elucidating such diverse phenomena as high-temperature superconductivity and protein folding. Optical Techniques for Solid-State Materials Characterization provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. The book explains how to use these techniques to acquire, analyze, and interpret data for gaining insight into material properties. With chapters written by pioneering experts in various optical techniques, the text first provides background on light–matter interactions, semiconductors, and metals before discussing linear, time-integrated optical experiments for measuring basic material properties, such as Fourier transform infrared spectroscopy, photoluminescence, and Raman scattering. The next section begins with a description of ultrashort pulse generation and carrier dynamics in semiconductors and metals. The book then discusses time-resolved optical techniques, such as pump–probe spectroscopy, terahertz spectroscopy, and magneto-optical spectroscopy. The subsequent section describes spatially resolved optical spectroscopy, including conventional optical microscopy and micro-optical and near-field scanning techniques. The book concludes with an overview of more advanced, emerging optical techniques, such as ultrafast x-ray and electron diffraction, ultrafast photoemission spectroscopy, and time-resolved optical microscopy. As optical techniques are among the first applied when studying new systems with novel properties, the information presented in this comprehensive reference will only grow in importance. By supplying clear, detailed explanations of these techniques, the book enables researchers to readily implement them and acquire new insights into the materials they study. CRC Press Authors Speak Rohit P. Prasankumar speaks about his book. Watch the Video



Materials Science and Engineering of Carbon

Materials Science and Engineering of Carbon Author Michio Inagaki
ISBN-10 9780128054680
Release 2016-06-07
Pages 338
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Materials Science and Engineering of Carbon: Characterization discusses 12 characterization techniques, focusing on their application to carbon materials, including X-ray diffraction, X-ray small-angle scattering, transmission electron microscopy, Raman spectroscopy, scanning electron microscopy, image analysis, X-ray photoelectron spectroscopy, magnetoresistance, electrochemical performance, pore structure analysis, thermal analyses, and quantification of functional groups. Each contributor in the book has worked on carbon materials for many years, and their background and experience will provide guidance on the development and research of carbon materials and their further applications. Focuses on characterization techniques for carbon materials Authored by experts who are considered specialists in their respective techniques Presents practical results on various carbon materials, including fault results, which will help readers understand the optimum conditions for the characterization of carbon materials



Advanced Characterization Techniques for Thin Film Solar Cells

Advanced Characterization Techniques for Thin Film Solar Cells Author Daniel Abou-Ras
ISBN-10 9783527699049
Release 2016-07-13
Pages 760
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The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.



Mechanical Tribology

Mechanical Tribology Author George E. Totten
ISBN-10 0203970918
Release 2004-04-22
Pages 508
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Studying the morphology, defects, and wear behavior of a variety of material surfaces, Mechanical Tribology examines popular and emerging surface characterization techniques for assessment of the physical, mechanical, and chemical properties of various modified surfaces, thin films, and coatings. Its chapters explore a wide range of tribological applications while promoting reduced component deterioration and improved efficiency and reliability of mechanical systems. The book includes extensive coverage of critical technologies that are usually absent in other references on the subject, delving into procedures affecting metal cutting and forming, physicochemical issues involved in the design of fiber finishes, and recent progress in biotribological research. It provides strategies to characterize the friction and wear properties of tribological systems and procedures to assess the quality and lifetime of ceramic materials. It also outlines methods to avoid scuffing and seizure in machine operations and novel techniques to prevent oil from spreading and creeping in lubricating applications. Mechanical Tribology is a practical guide for mechanical, industrial, chemical, process, design, and process engineers, materials scientists, and tribologists in the selection of materials, surface treatments, coatings, and environments best suited for a particular industrial application.



Microwave Electronics

Microwave Electronics Author L. F. Chen
ISBN-10 9780470020456
Release 2004-11-19
Pages 552
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The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book: Provides a comprehensive introduction to microwave theory and microwave measurement techniques. Examines every aspect of microwave material properties, circuit design and applications. Presents materials property characterisation methods along with a discussion of the underlying theory. Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications. Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences. This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.



Materials Characterization Techniques

Materials Characterization Techniques Author CTI Reviews
ISBN-10 9781467214605
Release 2016-10-17
Pages 26
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Facts101 is your complete guide to Materials Characterization Techniques. In this book, you will learn topics such as as those in your book plus much more. With key features such as key terms, people and places, Facts101 gives you all the information you need to prepare for your next exam. Our practice tests are specific to the textbook and we have designed tools to make the most of your limited study time.



Optical Techniques for Solid State Materials Characterization

Optical Techniques for Solid State Materials Characterization Author Rohit P. Prasankumar
ISBN-10 1439815372
Release 2011-07-05
Pages 748
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Over the last century, numerous optical techniques have been developed to characterize materials, giving insight into their optical, electronic, magnetic, and structural properties and elucidating such diverse phenomena as high-temperature superconductivity and protein folding. Optical Techniques for Solid-State Materials Characterization provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. The book explains how to use these techniques to acquire, analyze, and interpret data for gaining insight into material properties. With chapters written by pioneering experts in various optical techniques, the text first provides background on light–matter interactions, semiconductors, and metals before discussing linear, time-integrated optical experiments for measuring basic material properties, such as Fourier transform infrared spectroscopy, photoluminescence, and Raman scattering. The next section begins with a description of ultrashort pulse generation and carrier dynamics in semiconductors and metals. The book then discusses time-resolved optical techniques, such as pump–probe spectroscopy, terahertz spectroscopy, and magneto-optical spectroscopy. The subsequent section describes spatially resolved optical spectroscopy, including conventional optical microscopy and micro-optical and near-field scanning techniques. The book concludes with an overview of more advanced, emerging optical techniques, such as ultrafast x-ray and electron diffraction, ultrafast photoemission spectroscopy, and time-resolved optical microscopy. As optical techniques are among the first applied when studying new systems with novel properties, the information presented in this comprehensive reference will only grow in importance. By supplying clear, detailed explanations of these techniques, the book enables researchers to readily implement them and acquire new insights into the materials they study. CRC Press Authors Speak Rohit P. Prasankumar speaks about his book. Watch the Video



A Guide to Materials Characterization and Chemical Analysis

A Guide to Materials Characterization and Chemical Analysis Author John P. Sibilia
ISBN-10 0471186333
Release 1996
Pages 408
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This book provides an overview of the most current techniques used for chemical analysis, materials evaluation, and materials testing. Over 100 materials methodologies, evaluations, chemical analyses, physical testing, and scientific computing techniques are covered, including the fields of molecular spectroscopy, mass spectroscopy, chromatography, chemical analysis, x-ray analysis, microscopy, surface science, thermal analysis, and polymer characterization. All of the.



Physical Methods for Materials Characterisation Third Edition

Physical Methods for Materials Characterisation  Third Edition Author Peter E. J. Flewitt
ISBN-10 9781315363233
Release 2017-12-06
Pages 725
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This completely revised and expanded new edition covers the full range of techniques now available for the investigation of materials structure and accurate quantitative determination of microstructural features within materials. It continues to provide the best introductory resource for understanding the interrelationship between microstructure and physical, mechanical, and chemical properties, as well as selection and application of techniques for both basic and applied studies. In particular, changes have been made to reflect developments in analysis of nanoscale and biological materials.



Characterization of Composite Materials

Characterization of Composite Materials Author Hatsuo Ishida
ISBN-10 9781483292373
Release 2013-10-22
Pages 250
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Now, in one book, there is coverage of modern surface analytical techniques applied specifically to composite materials. Centering around spectroscopic characterization of composites and polymer-matrix composities, Characterization of Composite Materials covers techniques with a demonstrated use for composite stuides along with promising new techniques such as STM/AFM and special Raman spectroscopy. Each chapter will cover a specific technique and will provide basic background information, theories of the technique, and application examples, including futuristic state-of-the-art applications. Detailed information about the individual characterization techniques mentioned can be found in the Encyclopaedia of Materials Cahracterization, the companion volume in the Materials Characterization Series: surfaces, interfaces, thin films.



Materials Characterization

Materials Characterization Author Ramiro Pérez Campos
ISBN-10 9783319152042
Release 2015-04-27
Pages 223
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This book covers novel research results for process and techniques of materials characterization for a wide range of materials. The authors provide a comprehensive overview of the aspects of structural and chemical characterization of these materials. The articles contained in this book covers state of the art and experimental techniques commonly used in modern materials characterization. The book includes theoretical models and numerous illustrations of structural and chemical characterization properties.



Modern Glass Characterization

Modern Glass Characterization Author Mario Affatigato
ISBN-10 9781119051879
Release 2015-09-10
Pages 500
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The book consists of a series of edited chapters, each written by an expert in the field and focusing on a particular characterization technique as applied to glass. The book covers a variety of techniques ranging from the very common (like Raman and FTIR) to the most recent (and less well known) ones, like SEM for structural analysis and photoelastic measurements. The level of the chapters make it suitable for researchers and for graduate students about to start their research work. It will also: discuss the technique itself, background, nuances when it comes to looking at glassy materials, interpretation of results, case studies, and recent and near-future innovations Fill a widening gap in modern techniques for glass characterization Provide much needed updates on the multiple essential characterization techniques