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Semiconductor Superlattices and Interfaces

Semiconductor Superlattices and Interfaces Author A. Stella
ISBN-10 9781483290362
Release 2013-10-22
Pages 496
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This book is concerned with the dynamic field of semiconductor microstructures and interfaces. Several topics in the fundamental properties of interfaces, superlattices and quantum wells are included, as are papers on growth techniques and applications. The papers deal with the interaction of theory, experiments and applications within the field, and the outstanding contributions are from both the academic and industrial worlds.



Semiconductor superlattices and interfaces

Semiconductor superlattices and interfaces Author Società italiana di fisica
ISBN-10 0444816437
Release 1993-12
Pages 473
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This book is concerned with the dynamic field of semiconductor microstructures and interfaces. Several topics in the fundamental properties of interfaces, superlattices and quantum wells are included, as are papers on growth techniques and applications. The papers deal with the interaction of theory, experiments and applications within the field, and the outstanding contributions are from both the academic and industrial worlds.



Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures Author Maria Peressi
ISBN-10 9780128083352
Release 2013-04-11
Pages 828
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Characterization of Semiconductor Heterostructures and Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures Author Giovanni Agostini
ISBN-10 9780444595492
Release 2013-04-11
Pages 828
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Characterization of Semiconductor Heterostructures and Nanostructures is structured so that each chapter is devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc..) of semiconductor quantum wells and superlattices. An additional chapter is devoted to ab initio modeling. The book has two basic aims. The first is educational, providing the basic concepts of each of the selected techniques with an approach understandable by advanced students in Physics, Chemistry, Material Science, Engineering, Nanotechnology. The second aim is to provide a selected set of examples from the recent literature of the TOP results obtained with the specific technique in understanding the properties of semiconductor heterostructures and nanostructures. Each chapter has this double structure: the first part devoted to explain the basic concepts, and the second to the discussion of the most peculiar and innovative examples. The topic of quantum wells, wires and dots should be seen as a pretext of applying top level characterization techniques in understanding the structural, electronic etc properties of matter at the nanometer (and even sub-nanometer) scale. In this respect it is an essential reference in the much broader, and extremely hot, field of Nanotechnology. Comprehensive collection of the most powerful characterization techniques for semiconductors heterostructures and nanostructures Most of the chapters are authored by scientists that are world-wide among the top-ten in publication ranking of the specific field Each chapter starts with a didactic introduction on the technique The second part of each chapters deals with a selection of top examples highlighting the power of the specific technique to analyse the properties of semiconductors heterostructures and nanostructures



                                                                  Author 国立国会図書館 (Japan)
ISBN-10 UCLA:L0088319785
Release 1979
Pages
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Stranezza E Spin in Fisica Fondamentale

Stranezza E Spin in Fisica Fondamentale Author Mauro Anselmino
ISBN-10 9781586038847
Release 2008-01-01
Pages 469
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Presents discussion of the role played by two subtle and somehow puzzling quantum numbers, the strangeness and the spin, in fundamental physics.



The British National Bibliography

The British National Bibliography Author Arthur James Wells
ISBN-10 UOM:39015079755404
Release 1993
Pages
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Il Nuovo Cimento Della Societ Italiana Di Fisica

Il Nuovo Cimento Della Societ   Italiana Di Fisica Author
ISBN-10 CHI:41254848
Release 1994
Pages
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Aslib Book Guide

Aslib Book Guide Author
ISBN-10 MINN:31951P00552679D
Release 1994
Pages
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Encyclopedia of Applied Physics Scientific Computing by Numerical Methods to Separation Processes

Encyclopedia of Applied Physics  Scientific Computing by Numerical Methods to Separation Processes Author George L. Trigg
ISBN-10 3527281398
Release 1996-09-26
Pages 666
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The 23-volume Encyclopedia of Applied Physics - EAP - is a monumental first in scope, depth, and usability. It demonstrates the synergy between physics and technological applications. Information is presented according to the following subject areas: * General Aspects; Mathematical and Information Techniques * Measurement Sciences, General Devices and/or Methods * Nuclear and Elementary Particle Physics * Atomic and Molecular Physics * Electricity and Magnetism * Optics (classical and quantum) * Acoustics * Thermodynamics and Properties of Gases * Fluids and Plasma Physics * Condensed Matter: Structure and Mechanical Properties; Thermal, Acoustic, and Quantum Properties ; Electronic Properties ; Magnetic Properties ; Dielectrical and Optical Properties; Surfaces and Interfaces * Materials Science * Physical Chemistry * Energy Research and Environmental Physics * Biophysics and Medical Physics * Geophysics, Meteorology, Space Physics and Aeronautics EAP consists of 20 hardcover volumes arranged alphabetically. A cumulative subject index will be published after every three volumes, with a full index accompanying the complete work.



The Cumulative Book Index

The Cumulative Book Index Author
ISBN-10 UOM:39015058373781
Release 1995
Pages
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Frontiers of Fundamental Physics and Physics Education Research

Frontiers of Fundamental Physics and Physics Education Research Author Burra G. Sidharth
ISBN-10 9783319002972
Release 2014-03-20
Pages 615
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In a knowledge-based society, research into fundamental physics plays a vital role not only in the enhancement of human knowledge but also in the development of new technology that affects everyday life.The international symposium series Frontiers of Fundamental Physics (FFP) regularly brings together eminent scholars and researchers working in various areas in physics to exchange expertise, ideas, results, and new research perspectives. The twelfth such symposium, FFP12, took place at the University of Udine, Italy, and covered diverse fields of research: astrophysics, high energy physics and particle physics, theoretical physics, gravitation and cosmology, condensed matter physics, statistical physics, computational physics, and mathematical physics. Importantly, it also devoted a great deal of attention to physics education research, teacher training in modern physics, and popularization of physics. The high scientific level of FFP12 was guaranteed by the careful selection made by scientific coordinators from among 250 submissions from 28 countries across the world. During the three days of the conference, nine general talks were delivered in plenary sessions, 29 invited talks were given in specific topic areas, and 59 oral presentations were made. This book presents a selection of the best contributions at FFP12 with the aim of acquainting readers with the most important recent advances in fundamental physics and in physics education and teacher development.



Physics letters

Physics letters Author
ISBN-10 UCAL:B4488318
Release 1995
Pages
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Whitaker s Books in Print

Whitaker s Books in Print Author
ISBN-10 UOM:39015043806101
Release 1998
Pages
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Epioptics

Epioptics Author John F. McGilp
ISBN-10 9783642798207
Release 2012-12-06
Pages 230
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The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonolayer resolution, has been shown to be possible using optical techniques (where "optical" applies to electromagnetic radiation in and around the visible region of the spectrum). This book describes these "epioptic" techniques, which have now been quite widely applied to semiconductor surfaces and interfaces. Particular emphasis in the book is placed on recent studies of submonolayer growth on well-characterised semiconductor surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic Research Action No. 3177 "EPIOPTIC", and CEU DGIII ESPRIT Basic Research Action No. 6878 "EASI". Techniques using other areas of the spectrum such as the infra-red region (IR spectroscopy, in its various surface configurations), and the x-ray region (surface x-ray diffraction, x-ray standing wave), are omitted. The optical techniques described use simple lamp or small laser sources and are thus, in principle, easily accessible. Epioptic probes can provide new information on solid-gas, solid-liquid and liquid-liquid interfaces. They are particularly suited to growth monitoring. Emerging process technologies for fabricating submicron and nanoscale semiconductor devices and novel multilayer materials, whether based on silicon or compound semiconductors, all require extremely precise control of growth at surfaces. In situ, non-destructive, real-time monitoring and characterisation of surfaces under growth conditions is needed for further progress. Both atomic scale resolution, and non-destructive characterisation of buried structures, are required.



Physics Briefs

Physics Briefs Author
ISBN-10 UOM:39015027832966
Release 1994
Pages
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Metrology from Physics Fundamentals to Quality of Life

Metrology  from Physics Fundamentals to Quality of Life Author P. Tavella
ISBN-10 9781614998181
Release 2018-01-03
Pages 528
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Metrology is a constantly evolving field, and one which has developed in many ways in the last four decades. This book presents the proceedings of the Enrico Fermi Summer School on the topic of Metrology, held in Varenna, Italy, from 26 June to 6 July 2017. This was the 6th Enrico Fermi summer school devoted to metrology, the first having been held in 1976. The 2017 program addressed two major new directions for metrology: the work done in preparation for a possible re-definition of four of the base units of the SI in 2018, and the impact of the application of metrology to issues addressing quality of life – such as global climate change and clinical and food analysis – on science, citizens and society. The lectures were grouped into three modules: metrology for quality of life; fundamentals of metrology; and physical metrology and fundamental constants, and topics covered included food supply and safety; biomarkers; monitoring climate and air quality; new IS units; measurement uncertainty; fundamental constants; electrical metrology; optical frequency standards; and photometry and light metrology. The book provides an overview of the topics and changes relevant to metrology today, and will be of interest to both academics and all those whose work involves any of the various aspects of this field.