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X ray Photoelectron Spectroscopy

X ray Photoelectron Spectroscopy Author Paul van der Heide
ISBN-10 9781118162903
Release 2011-11-01
Pages 264
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This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections.

X ray Photoelectron Spectroscopy

X ray Photoelectron Spectroscopy Author Paul van der Heide
ISBN-10 1118062531
Release 2011-12-20
Pages 264
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X ray Photoelectron Spectroscopy has been writing in one form or another for most of life. You can find so many inspiration from X ray Photoelectron Spectroscopy also informative, and entertaining. Click DOWNLOAD or Read Online button to get full X ray Photoelectron Spectroscopy book for free.

X ray Photoelectron Spectroscopy

X ray Photoelectron Spectroscopy Author Paul van der Heide
ISBN-10 9781118162927
Release 2011-11-01
Pages 256
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X ray Photoelectron Spectroscopy has been writing in one form or another for most of life. You can find so many inspiration from X ray Photoelectron Spectroscopy also informative, and entertaining. Click DOWNLOAD or Read Online button to get full X ray Photoelectron Spectroscopy book for free.

Photoelectron Spectroscopy

Photoelectron Spectroscopy Author Stefan Hüfner
ISBN-10 9783662031506
Release 2013-11-11
Pages 515
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An up-to-date introduction to the field, treating in depth the electronic structures of atoms, molecules, solids and surfaces, together with brief descriptions of inverse photoemission, spin-polarized photoemission and photoelectron diffraction. Experimental aspects are considered throughout and the results carefully interpreted by theory. A wealth of measured data is presented in tabullar for easy use by experimentalists.

Auger and X Ray Photoelectron Spectroscopy in Materials Science

Auger  and X Ray Photoelectron Spectroscopy in Materials Science Author Siegfried Hofmann
ISBN-10 9783642273803
Release 2012-10-25
Pages 528
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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Modern ESCAThe Principles and Practice of X Ray Photoelectron Spectroscopy

Modern ESCAThe Principles and Practice of X Ray Photoelectron Spectroscopy Author Tery L. Barr
ISBN-10 0849386535
Release 1994-03-10
Pages 384
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Modern ESCA: The Principles and Practice of X-Ray Photoelectron Spectroscopy is a unique text/reference that focuses on the branch of electron spectroscopy generally labeled as either Electron Spectroscopy for Chemical Analysis (ESCA) or X-ray Photoelectron Spectroscopy (XPS). The book emphasizes the use of core level and valence band binding energies, their shifts, and line widths. It describes the background, present status, and possible future uses of a number of recently developed branches of ESCA, including:

Photoelectron Spectroscopy

Photoelectron Spectroscopy Author A. D. Baker
ISBN-10 9781483152363
Release 2013-10-22
Pages 190
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Photoelectron Spectroscopy provides an introduction to the principles of photoelectron spectroscopy, including its applications in structural and analytical chemistry. It deals with both X-ray and UV-photoelectron spectroscopy. This book begins with the basic principles of electron spectroscopy and describes the UV photoelectron spectrometers and X-ray photoelectron spectrometers. It then lists several factors influencing the appearance of the photoelectron spectra. This book concludes by describing other forms of electron spectroscopy and photoelectron techniques. Students and chemists who are looking for a readable introduction to photoelectron spectroscopy will find this book useful.

An Introduction to Surface Analysis by XPS and AES

An Introduction to Surface Analysis by XPS and AES Author John F. Watts
ISBN-10 0470847123
Release 2003-05-23
Pages 212
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Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. * Includes an accessible introduction to the key spectroscopic techniques in surface analysis. * Provides descriptions of latest instruments and techniques. * Includes a detailed glossary of key surface analysis terms.

Handbook of X ray Photoelectron Spectroscopy

Handbook of X ray Photoelectron Spectroscopy Author John F. Moulder
ISBN-10 096481241X
Release 1995
Pages 261
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Handbook of X ray Photoelectron Spectroscopy has been writing in one form or another for most of life. You can find so many inspiration from Handbook of X ray Photoelectron Spectroscopy also informative, and entertaining. Click DOWNLOAD or Read Online button to get full Handbook of X ray Photoelectron Spectroscopy book for free.

Hard X ray Photoelectron Spectroscopy HAXPES

Hard X ray Photoelectron Spectroscopy  HAXPES Author Joseph C. Woicik
ISBN-10 9783319240435
Release 2015-12-26
Pages 571
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This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.

Surface and Thin Film Analysis

Surface and Thin Film Analysis Author Gernot Friedbacher
ISBN-10 9783527636945
Release 2011-03-31
Pages 558
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Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)

An Introduction to Surface Analysis by Electron Spectroscopy

An Introduction to Surface Analysis by Electron Spectroscopy Author John F. Watts
ISBN-10 0198564252
Release 1990
Pages 85
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Surface analysis--the examination of the outer few nanometers of a material--is a routine undertaking in laboratories throughout the world, and is of great importance in such areas as corrosion, adhesion, polymer surface treatment, and microelectronics fabrication. This handbook provides an introduction to the two most popular surface analysis techniques: X-ray photoelectron spectroscopy and Auger electron spectroscopy. It explains the underlying physical principles, discusses instrumentation, and looks at the interpretation of resulting spectra. Applications of the two techniques are considered, and a critical comparison with other available methods is also included. This fully illustrated guide will be a valuable introduction for students and researchers in physics, engineering, and materials science.

The X ray Standing Wave Technique

The X ray Standing Wave Technique Author Jörg Zegenhagen
ISBN-10 9812779000
Release 2012-09-30
Pages 534
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The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge in quite different fields of physics and technology. This volume presents comprehensively the theoretical background, technical requirements and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik and D Phil Woodruff, the book equips scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications.

Materials Characterization Techniques

Materials Characterization Techniques Author Sam Zhang
ISBN-10 9781420042955
Release 2008-12-22
Pages 344
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Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today—whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material’s structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use. Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. This useful volume: Explores scientific processes to characterize materials using modern technologies Provides analysis of materials’ performance under specific use conditions Focuses on the interrelationships and interdependence between processing, structure, properties, and performance Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanisms, and materials Covers electron, X-ray-photoelectron, and UV spectroscopy; scanning-electron, atomic-force, transmission-electron, and laser-confocal-scanning-florescent microscopy, and gel electrophoresis chromatography Presents the fundamentals of vacuum, as well as X-ray diffraction principles Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations. Instead, they emphasize useful basic principles and applications of modern technologies used to characterize engineering materials, helping readers grasp micro- and nanoscale properties. This text will serve as a valuable guide for scientists and engineers involved in characterization and also as a powerful introduction to the field for advanced undergraduate and graduate students.

Atomic and Molecular Spectroscopy

Atomic and Molecular Spectroscopy Author Sune Svanberg
ISBN-10 9783642973987
Release 2012-12-06
Pages 407
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A wide-ranging review of modern techniques in atomic and molecular spectroscopy. A brief description of atomic and molecular structure is followed by the relevant energy structure expressions. A discussion of radiative properties and the origin of spectra leads into coverage of X-ray and photoelectron spectroscopy, optical spectroscopy, and radiofrequency and microwave techniques. The treatment of laser spectroscopy investigates various tunable sources and a wide range of techniques characterized by high sensitivity and high resolution. Throughout this book, the relation between fundamental and applied aspects is shown, in particular by descriptions of applications to chemical analysis, photochemistry, surface characterisation, environmental and medical diagnostics, remote sensing and astrophysics.

Molten Salt Chemistry

Molten Salt Chemistry Author Gleb Mamantov
ISBN-10 9789400938632
Release 2012-12-06
Pages 525
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Molten salts are of considerable significance to chemical technology. Applications range from the established ones, such as the production of aluminum, magnesium, sodium and fluorine, to those as yet to be fully exploited, such as molten salt batteries and fuel cells, catalysis, and solar energy. Molten salts are investigated for different purposes by many diverse techniques. There is a need to keep investigators working in different areas, such as metal production, power sources, and glass industry, aware of progress in various specialties, as well as to familiarize new research workers with the fundamental aspects of the broad field of molten salt _ chemistry. This volume constitutes the plenary lectures presented at the NATO Advanced Study Institute on Molten Salt Chemistry, Camerino, Italy, August 3-15, 1986. The fundamentals and several selected applications of molten salt chemistry were addressed. The major fundamental topics covered at this ASI were the structure of melts, thermodynamics of molten salt mixtures, theoretical and experimental studies of transport processes, metal-metal salt solutions, solvent properties of melt systems, acid-base effects in molten salt chemistry, electronic absorption, vibrational, and nuclear magnetic resonance spectroscopy of melt systems, electrochemistry and electroanalytical chemistry in molten salts, and organic chemistry in molten salts. The applied aspects of molten salt chemistry included the chemistry of aluminum production, electrodeposition using molten salts, and molten salt batteries and fuel cells.

Spectroscopy of Polymer Nanocomposites

Spectroscopy of Polymer Nanocomposites Author Sabu Thomas
ISBN-10 9780323413916
Release 2016-02-16
Pages 498
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Spectroscopy of Polymer Nanocomposites covers all aspects of the spectroscopic characterization of polymer nanocomposites. More than 25 spectroscopy characterization techniques – almost all used in materials science – are treated in the book, with discussion of their potentialities and limitations. By comparing the techniques with each other and presenting the techniques together with their specific application areas, the book provides scientists and engineers the information needed for solving specific problems and choosing the right technique for analyzing the material structure. From this, the dispersion structure of fillers, property relations and filler-polymer interactions can be determined, and, ultimately, the right materials can be chosen for the right applications. Besides the techniques and structure-property relations, aspects covered include: phase segregation of filler particles, filler agglomeration and deagglomeration, filler dispersion, filler-polymer interactions, surfaces and interfaces. The book also examines recent developments, as well as unresolved issues and new challenges, in the characterization of surfaces and interfaces in polymer nanocomposites. This handpicked selection of topics, and the combined expertise of contributors from industry, academia, government and private research organizations across the globe, make this survey an outstanding reference source for anyone involved in the field of polymer nanocomposites in academia or industry. Provides comprehensive coverage of spectroscopy techniques for analyzing polymer nanocomposites Enables researchers and engineers to choose the right technique and make better materials decisions in research and a range of industries Presents the fundamentals, information on structure-property relations, and all other aspects relevant for understanding spectroscopic analyses of nanoreinforced polymers and their applications